Invention Grant
- Patent Title: Light measurement device and light measurement method
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Application No.: US16963039Application Date: 2018-10-10
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Publication No.: US11346720B2Publication Date: 2022-05-31
- Inventor: Kengo Suzuki , Shigeru Eura , Kazuya Iguchi
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JPJP2018-009045 20180123
- International Application: PCT/JP2018/037780 WO 20181010
- International Announcement: WO2019/146172 WO 20190801
- Main IPC: G01J3/443
- IPC: G01J3/443 ; G01N21/64

Abstract:
In a spectrometry device, a control unit controls a light source so that input of excitation light to an internal space is maintained in a first period, and that the input of the excitation light to the internal space is stopped in a second period, and the analysis unit calculates the photoluminescence quantum yield of a long afterglow emission material on the basis of the number of absorbed photons of the long afterglow emission material obtained on the basis of excitation light spectral data in the first period and the number of light emission photons of the long afterglow emission material obtained on the basis of light emission spectral data in any of the first period, the second period, and a total period of the first period and the second period.
Public/Granted literature
- US20200340862A1 LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD Public/Granted day:2020-10-29
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