Invention Grant
- Patent Title: FinFET having fluorine-doped gate sidewall spacers
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Application No.: US16745347Application Date: 2020-01-17
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Publication No.: US11355615B2Publication Date: 2022-06-07
- Inventor: Wei-Lun Min , Chang-Miao Liu , Xu-Sheng Wu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L29/49
- IPC: H01L29/49 ; H01L29/78 ; H01L29/06 ; H01L29/417 ; H01L29/66 ; H01L21/3115 ; H01L21/762 ; H01L21/285 ; H01L21/8234 ; H01L21/265 ; H01L21/768

Abstract:
Field effect transistor and manufacturing method thereof are disclosed. The field effect transistor includes a substrate, fins, a gate structure, a first spacer and a second spacer. The fins protrude from the substrate and extend in a first direction. The gate structure is disposed across and over the fins and extends in a second direction perpendicular to the first direction. The first spacer is disposed on sidewalls of the gate structure. The second spacer is disposed on the first spacer and surrounds the gate structure. The first spacer is fluorine-doped and includes fluorine dopants.
Public/Granted literature
- US20210226030A1 FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2021-07-22
Information query
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