Invention Grant
- Patent Title: Apparatus and method to electrostatically remove foreign matter from substrate surfaces
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Application No.: US16573744Application Date: 2019-09-17
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Publication No.: US11376640B2Publication Date: 2022-07-05
- Inventor: Antonio Luis Pacheco Rotondaro , Derek Bassett , Trace Quentin Hurd , Ihsan Simms
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Slater Matsil, LLP
- Main IPC: B08B6/00
- IPC: B08B6/00 ; H01L21/683 ; H01J37/32 ; H01L21/67

Abstract:
In one exemplary embodiment, described herein are innovative techniques for reducing the attractive force between particles and a substrate surface to aid in the removal of particles from the substrate surface. More specifically, a multi-electrode chuck is utilized to assist in cleaning a substrate. The multi-electrode chuck is utilized to reduce the attractive forces between particles and the substrate and to move the loosened particles that are present on the substrate surface. The electrodes of the chuck are biased with alternating current (AC) voltages with a phase shift between the electrode bias waves. The resulting electric field wave on the substrate surface loosens the particles by polarizing the particles and moves the loosened particles across the substrate.
Information query
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