• Patent Title: Accelerator mass spectrometry measuring method and system
  • Application No.: US17017794
    Application Date: 2020-09-11
  • Publication No.: US11410841B2
    Publication Date: 2022-08-09
  • Inventor: Shan Jiang
  • Applicant: Shan Jiang
  • Applicant Address: CN Beijing
  • Assignee: Shan Jiang
  • Current Assignee: Shan Jiang
  • Current Assignee Address: CN Beijing
  • Priority: CN201810201635.6 20180312
  • Main IPC: H01J49/00
  • IPC: H01J49/00 H01J49/10
Accelerator mass spectrometry measuring method and system
Abstract:
An accelerator mass spectrometry measuring system is disclosed, including: an ECR high-current positive ion source subsystem; an injector subsystem; a high-current accelerator subsystem; a high-energy analysis subsystem; and a high-resolution detector subsystem; of which, the ECR high-current positive ion source subsystem, the injector subsystem, the high-current accelerator subsystem, high-energy analysis subsystem and a high-resolution detector subsystem are connected sequentially; the ECR high-current positive ion source subsystem is configured for generating high-current positive ions of multi-charge states; the high-current accelerator subsystem is configured for accelerating the high-current positive ions. The AMS system is high in beam, high in overall efficiency, and strong in how-down capability, and can greatly improve the abundance sensitivity of measurement.
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