Invention Grant
- Patent Title: Accelerator mass spectrometry measuring method and system
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Application No.: US17017794Application Date: 2020-09-11
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Publication No.: US11410841B2Publication Date: 2022-08-09
- Inventor: Shan Jiang
- Applicant: Shan Jiang
- Applicant Address: CN Beijing
- Assignee: Shan Jiang
- Current Assignee: Shan Jiang
- Current Assignee Address: CN Beijing
- Priority: CN201810201635.6 20180312
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/10

Abstract:
An accelerator mass spectrometry measuring system is disclosed, including: an ECR high-current positive ion source subsystem; an injector subsystem; a high-current accelerator subsystem; a high-energy analysis subsystem; and a high-resolution detector subsystem; of which, the ECR high-current positive ion source subsystem, the injector subsystem, the high-current accelerator subsystem, high-energy analysis subsystem and a high-resolution detector subsystem are connected sequentially; the ECR high-current positive ion source subsystem is configured for generating high-current positive ions of multi-charge states; the high-current accelerator subsystem is configured for accelerating the high-current positive ions. The AMS system is high in beam, high in overall efficiency, and strong in how-down capability, and can greatly improve the abundance sensitivity of measurement.
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