Invention Grant
- Patent Title: Charged particle beam apparatus
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Application No.: US16641035Application Date: 2017-09-04
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Publication No.: US11430630B2Publication Date: 2022-08-30
- Inventor: Ryo Hirano , Tsunenori Nomaguchi , Chisato Kamiya , Junichi Katane
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2017/031788 WO 20170904
- International Announcement: WO2019/043945 WO 20190307
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/141 ; H01J37/20 ; H01J37/30

Abstract:
The present invention realizes a composite charged particle beam apparatus capable of suppressing a leakage magnetic field from a pole piece forming an objective lens of an SEM with a simple structure. The charged particle beam apparatus according to the present invention obtains an ion beam observation image while passing a current to a first coil constituting the objective lens, and performs an operation of reducing the image shift by passing a current to a second coil with a plurality of current values, and determines a current to be passed to the second coil based on a difference between the operations.
Public/Granted literature
- US20200219697A1 Charged Particle Beam Apparatus Public/Granted day:2020-07-09
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