Invention Grant
- Patent Title: Methods of inspecting samples with multiple beams of charged particles
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Application No.: US16833463Application Date: 2020-03-27
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Publication No.: US11430631B2Publication Date: 2022-08-30
- Inventor: Kuo-Shih Liu , Xuedong Liu , Wei Fang , Jack Jau
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/26

Abstract:
Disclosed herein is a method comprising: generating a plurality of probe spots on a sample by a plurality of beams of charged particles; while scanning the plurality of probe spots across a region on the sample, recording from the plurality of probe spots a plurality of sets of signals respectively representing interactions of the plurality of beams of charged particles and the sample; generating a plurality of images of the region respectively from the plurality of sets of signals; and generating a composite image of the region from the plurality of images.
Public/Granted literature
- US20200227233A1 METHODS OF INSPECTING SAMPLES WITH MULTIPLE BEAMS OF CHARGED PARTICLES Public/Granted day:2020-07-16
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