Invention Grant
- Patent Title: Surveying instrument
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Application No.: US16524330Application Date: 2019-07-29
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Publication No.: US11435457B2Publication Date: 2022-09-06
- Inventor: Ken-ichiro Yoshino , Taizo Eno , Hideki Morita , Kohei Fujita
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JPJP2018-146747 20180803
- Main IPC: G01S7/499
- IPC: G01S7/499 ; G01S7/48 ; G01S17/42 ; G01S7/481

Abstract:
A surveying instrument comprises a projection optical system for irradiating a distance measuring light which is a linearly-polarized light to an object to be measured, a light receiving optical system for receiving a reflected distance measuring light from the object to be measured, a polarization selecting module for selecting a polarization of the reflected distance measuring light received by the light receiving optical system and an arithmetic control module for controlling a distance measurement based on a light receiving result of the reflected distance measuring light, wherein the arithmetic control module is configured to give a material information to a distance measurement result of the object to be measured based on a change in light receiving amounts caused due to a selection of the polarization by the polarization selecting module.
Public/Granted literature
- US20200041626A1 Surveying Instrument Public/Granted day:2020-02-06
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