Invention Grant
- Patent Title: Environmental scanning electron microscopy analysis for contact lens coating selection and manufacturing
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Application No.: US16695986Application Date: 2019-11-26
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Publication No.: US11520167B2Publication Date: 2022-12-06
- Inventor: Xinfeng Shi , James Yuliang Wu , David B. Cantu-Crouch
- Applicant: Alcon Inc.
- Applicant Address: CH Fribourg
- Assignee: Alcon Inc.
- Current Assignee: Alcon Inc.
- Current Assignee Address: CH Fribourg
- Agent Sheng-Hsin Hu
- Main IPC: G02C7/04
- IPC: G02C7/04 ; H01J37/28

Abstract:
Use of high resolution environmental scanning electron microscopy to capture images of contact lens coating layers, enabling measurement of the coating thickness and structures of the coating layer to be precisely characterized. The coating layer can be directly visualized and quantitatively measured. Furthermore, controlled environments of varying temperatures and varying levels of relative humidity can be established in environmental scanning electron microscopy, such that the dynamic changes of the coating in such conditions can be imaged and measured. The controlled environments can be set up to mimic either the manufacturing process conditions, or be set up to simulate lens-on-eye conditions.
Public/Granted literature
- US20200174283A1 Environmental Scanning Electron Microscopy Analysis for Contact Lens Coating Selection and Manufacturing Public/Granted day:2020-06-04
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