Invention Grant
- Patent Title: X-ray fluorescence measurement apparatus
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Application No.: US16928347Application Date: 2020-07-14
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Publication No.: US11549896B2Publication Date: 2023-01-10
- Inventor: Genki Kinugasa
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2019-132751 20190718
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/223 ; G01M3/02 ; G01N23/2204

Abstract:
An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.
Public/Granted literature
- US20210018453A1 X-Ray Fluorescence Measurement Apparatus Public/Granted day:2021-01-21
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