Invention Grant
- Patent Title: Apparatus for and method of in-situ particle removal in a lithography apparatus
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Application No.: US17418478Application Date: 2019-12-12
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Publication No.: US11550231B2Publication Date: 2023-01-10
- Inventor: Jeffrey John Lombardo , Ronald Peter Albright , Daniel Leslie Hall , Victor Antonio Perez-Falcon , Andrew Judge
- Applicant: ASML Holding N.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Holding N.V.
- Current Assignee: ASML Holding N.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- International Application: PCT/EP2019/084831 WO 20191212
- International Announcement: WO2020/136013 WO 20200702
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
Methods and systems are described for reducing particulate contaminants on a clamping face of a clamping structure in a lithographic system. A substrate such as a cleaning reticle is pressed against the clamping face. A temperature differential is established between the substrate and the clamping face either before or after clamping occurs to facilitate transfer of particles from the clamping face to the substrate.
Public/Granted literature
- US20220075277A1 APPARATUS FOR AND METHOD OF IN-SITU PARTICLE REMOVAL IN A LITHOGRAPHY APPARATUS Public/Granted day:2022-03-10
Information query
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