Invention Grant
- Patent Title: Readout circuits and methods
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Application No.: US17048046Application Date: 2019-04-17
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Publication No.: US11555744B2Publication Date: 2023-01-17
- Inventor: Edward Chan , Bing Wen , John Hong , Tallis Chang , Seung-Tak Ryu
- Applicant: Obsidian Sensors, Inc.
- Applicant Address: US CA San Diego
- Assignee: Obsidian Sensors, Inc.
- Current Assignee: Obsidian Sensors, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Morrison & Foerster LLP
- International Application: PCT/US2019/027982 WO 20190417
- International Announcement: WO2019/204515 WO 20191024
- Main IPC: G01J5/24
- IPC: G01J5/24 ; G01J1/42 ; G01J1/46 ; G01J5/02 ; H04N5/33 ; G01J1/44 ; G01J5/80

Abstract:
Methods of sensor readout and calibration and circuits for performing the methods are disclosed. In some embodiments, the methods include driving an active sensor at a voltage. In some embodiments, the methods include use of a calibration sensor, and the circuits include the calibration sensor. In some embodiments, the methods include use of a calibration current source and circuits include the calibration current source. In some embodiments, a sensor circuit includes a Sigma-Delta ADC. In some embodiments, a column of sensors is readout using first and second readout circuits during a same row time.
Public/Granted literature
- US20210102844A1 READOUT CIRCUITS AND METHODS Public/Granted day:2021-04-08
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