Invention Grant
- Patent Title: Radiation temperature measuring device
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Application No.: US16467651Application Date: 2017-12-04
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Publication No.: US11573128B2Publication Date: 2023-02-07
- Inventor: Hiroyuki Sasaki , Masaru Sugiyama
- Applicant: ASAHI KASEI KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: ASAHI KASEI KABUSHIKI KAISHA
- Current Assignee: ASAHI KASEI KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JPJP2016-237745 20161207
- International Application: PCT/JP2017/043454 WO 20171204
- International Announcement: WO2018/105551 WO 20180614
- Main IPC: G01J5/59
- IPC: G01J5/59 ; G01J5/06 ; G01J5/10 ; G02B5/30 ; G01J5/60 ; G01J5/48

Abstract:
An object of the present invention is to provide a radiation temperature measuring device capable of preventing reduction in the accuracy of temperature measurement due to an electromagnetic wave reflected by a measurement target. A radiation temperature measuring device includes a reflective polarizing plate configured to reflect a polarized wave of one direction in an electromagnetic wave radiated from an object to be measured and transmit or absorb a polarized wave of a direction perpendicular to the one direction and an infrared sensor configured to detect the polarized electromagnetic wave of the one direction reflected by the reflective polarizing plate.
Public/Granted literature
- US20200080897A1 RADIATION TEMPERATURE MEASURING DEVICE Public/Granted day:2020-03-12
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