Invention Grant
- Patent Title: Calibration assembly for scan device and calibration system
-
Application No.: US17131515Application Date: 2020-12-22
-
Publication No.: US11573175B2Publication Date: 2023-02-07
- Inventor: Yu-Tai Li , Wei-Yu Lin , Chia-Jen Lin , Chin Lien , Cho-Fan Hsieh
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: G01N21/3581
- IPC: G01N21/3581 ; G01N21/59

Abstract:
The disclosure provides a calibration assembly for a scan device. The calibration assembly includes a plurality of light-permeable plates and a reflection plate. The light-permeable plates are different in size, and the light-permeable plates are arranged along thicknesses directions thereof to form a step shape. The light-permeable plates define a plurality of light-permeable areas that respectively have different numbers of layers of the light-permeable plates inversely proportional to transmittances of the light-permeable areas. The light-permeable areas are configured to be permeable to a light having a predetermined frequency. The reflection plate is disposed at a side of one of the light-permeable plates in the thickness direction thereof. The reflection plate has a plurality of first holes having different sizes, and the reflection plate is configured to block the light having the predetermined frequency. The disclosure also provides a calibration system having the calibration assembly.
Public/Granted literature
- US20220196549A1 CALIBRATION ASSEMBLY FOR SCAN DEVICE AND CALIBRATION SYSTEM Public/Granted day:2022-06-23
Information query
IPC分类: