Invention Grant
- Patent Title: Analysis device
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Application No.: US17225558Application Date: 2021-04-08
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Publication No.: US11587777B2Publication Date: 2023-02-21
- Inventor: Masamitsu Moritani , Katsuhiko Kyuhken , Shohei Komaru , Tadashi Iwamatsu , Satoshi Morimoto
- Applicant: SHARP KABUSHIKI KAISHA
- Applicant Address: JP Sakai
- Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee Address: JP Sakai
- Agency: ScienBiziP, P.C.
- Priority: JPJP2020-076165 20200422
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/28 ; G01N27/622

Abstract:
An analysis device includes an electron emission element, a collector, an electric field former, a power source, and a controller. The electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode. The power source and the controller allow application of a voltage between the bottom electrode and the surface electrode. The electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector. The collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector. The controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.
Public/Granted literature
- US20210335590A1 ANALYSIS DEVICE Public/Granted day:2021-10-28
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