Invention Grant
- Patent Title: Analyzing apparatus and analyzing method
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Application No.: US16105194Application Date: 2018-08-20
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Publication No.: US11598737B2Publication Date: 2023-03-07
- Inventor: Takeshi Umemoto , Shinya Nishimura , Susumu Ito , Nobuaki Okubo
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JPJP2017-159548 20170822
- Main IPC: G01N25/48
- IPC: G01N25/48

Abstract:
An analyzing apparatus includes a memory unit that stores analysis conditions of each standards specifying analysis conditions for each analytical technique, a control unit, and an analysis unit that performs an analysis in accordance with a predetermined analytical technique. The control unit reads out the analysis conditions of the standard, and the control unit displays analysis conditions in time sequence, the displayed analysis conditions being necessary for the analysis and selected from out of the read-out analysis conditions, or the control unit prompts to input the analysis conditions in time sequence. When the analysis conditions are input, the control unit determines whether or not the input analysis conditions comply with the read-out analysis conditions, and in a case where a result of the determination is positive, the control unit displays a next analysis condition being necessary for the analysis, or the control unit prompts to input the next analysis condition.
Public/Granted literature
- US20190064091A1 Analyzing Apparatus and Analyzing Method Public/Granted day:2019-02-28
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