Invention Grant
- Patent Title: Automated artifact detection
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Application No.: US17030250Application Date: 2020-09-23
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Publication No.: US11640711B2Publication Date: 2023-05-02
- Inventor: Nicholas Malaya , Max Kiehn
- Applicant: Advanced Micro Devices, Inc. , ATI Technologies ULC
- Applicant Address: US CA Santa Clara; CA Markham
- Assignee: Advanced Micro Devices, Inc.,ATI Technologies ULC
- Current Assignee: Advanced Micro Devices, Inc.,ATI Technologies ULC
- Current Assignee Address: US CA Santa Clara; CA Markham
- Agency: Volpe Koenig
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/62 ; G06V20/40

Abstract:
A technique for generating a trained discriminator is provided. The technique includes applying one or more of a glitched image or an unglitched image to a discriminator; receiving classification output from the discriminator; adjusting weights of the discriminator to improve classification accuracy of the discriminator; applying noise to a generator; receiving an output image from the generator; applying the output image to the discriminator to obtain a classification; and adjusting weights of one of the discriminator or the generator to improve ability of the generator to reduce classification accuracy of the discriminator, based on the classification.
Public/Granted literature
- US20210383527A1 AUTOMATED ARTIFACT DETECTION Public/Granted day:2021-12-09
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