Invention Grant
- Patent Title: Measuring apparatus, measuring method, and program
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Application No.: US16492097Application Date: 2018-02-19
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Publication No.: US11666228B2Publication Date: 2023-06-06
- Inventor: Asao Hirano , Tomoyuki Tougasaki , Takeshi Higuchi
- Applicant: KYOCERA Corporation
- Applicant Address: JP Kyoto
- Assignee: KYOCERA Corporation
- Current Assignee: KYOCERA Corporation
- Current Assignee Address: JP Kyoto
- Agency: Studebaker & Brackett PC
- Priority: JP 2017044077 2017.03.08 JP 2017161545 2017.08.24
- International Application: PCT/JP2018/005805 2018.02.19
- International Announcement: WO2018/163784A 2018.09.13
- Date entered country: 2019-09-06
- Main IPC: A61B5/0205
- IPC: A61B5/0205 ; A61B5/026 ; A61B5/1455 ; A61B5/00 ; G01J3/44 ; A61B5/022

Abstract:
A measuring apparatus includes a first laser light source for emitting laser light of a first wavelength, a second laser light source for emitting laser light of a second wavelength different from the first wavelength, an optical detector for receiving scattered laser light from a measured part, and a controller configured to calculate a first value based on an output of the optical detector that is based on received scattered laser light of the first wavelength, calculate a second value based on an output of the optical detector that is based on received scattered laser light of the second wavelength, and measure oxygen saturation based on a ratio of the first value to the second value.
Public/Granted literature
- US20200297221A1 MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM Public/Granted day:2020-09-24
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