- Patent Title: Method and image processing device for mura detection on display
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Application No.: US16944165Application Date: 2020-07-31
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Publication No.: US11676265B2Publication Date: 2023-06-13
- Inventor: Chih-Yu Chu , Po-Yuan Hsieh , Chieh-En Lee , Chung-Hao Tien , Shih-Hsuan Chen
- Applicant: Novatek Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: Novatek Microelectronics Corp.
- Current Assignee: Novatek Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: G06T5/20
- IPC: G06T5/20 ; G06T7/00 ; G06T7/11 ; G06V10/25 ; G06F18/22
Abstract:
A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.
Public/Granted literature
- US20220036527A1 METHOD AND IMAGE PROCESSING DEVICE FOR MURA DETECTION ON DISPLAY Public/Granted day:2022-02-03
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