Invention Grant
- Patent Title: Sample pre-charging methods and apparatuses for charged particle beam inspection
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Application No.: US16652025Application Date: 2018-09-25
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Publication No.: US11676792B2Publication Date: 2023-06-13
- Inventor: Xuedong Liu , Qingpo Xi , Youfei Jiang , Weiming Ren , Xuerang Hu , Zhongwei Chen
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands, B.V
- Current Assignee: ASML Netherlands, B.V
- Current Assignee Address: NL Veldhoven
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- International Application: PCT/EP2018/075996 2018.09.25
- International Announcement: WO2019/063561A 2019.04.04
- Date entered country: 2020-03-27
- Main IPC: H01J37/12
- IPC: H01J37/12 ; H01J37/28

Abstract:
Disclosed herein is an apparatus comprising: a source of charged particles configured to emit a beam of charged particles along a primary beam axis of the apparatus; a condenser lens configured to cause the beam to concentrate around the primary beam axis; an aperture; a first multi-pole lens; a second multi-pole lens; wherein the first multi-pole lens is downstream with respect to the condenser lens and upstream with respect to the second multi-pole lens; wherein the second multi-pole lens is downstream with respect to the first multi-pole lens and upstream with respect to the aperture.
Public/Granted literature
- US20200266023A1 SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BEAM INSPECTION Public/Granted day:2020-08-20
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