Invention Grant
- Patent Title: Sample loading method and charged particle beam apparatus
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Application No.: US17570077Application Date: 2022-01-06
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Publication No.: US11705303B2Publication Date: 2023-07-18
- Inventor: Tomoyuki Naganuma , Naoki Fujimoto , Takeshi Kaneko
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP 21001503 2021.01.07
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/26

Abstract:
Provided is a sample loading method of loading a cooled sample into a sample exchange chamber of a charged particle beam apparatus includes: attaching the sample container in which a sample and liquid nitrogen are accommodated to the sample exchange chamber via a gate valve; evacuating a space between a liquid surface of the liquid nitrogen and the gate valve in a state in which the gate valve is closed; discharging the liquid nitrogen in the sample container after the space between the liquid surface of the liquid nitrogen and the gate valve has been evacuated; evacuating a space in the sample container after the liquid nitrogen in the sample container has been discharged; and opening the gate valve after the space in the sample container has been evacuated.
Public/Granted literature
- US20220216030A1 Sample Loading Method and Charged Particle Beam Apparatus Public/Granted day:2022-07-07
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