Invention Grant
- Patent Title: Method and apparatus for image analysis
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Application No.: US17497207Application Date: 2021-10-08
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Publication No.: US11720029B2Publication Date: 2023-08-08
- Inventor: Scott Anderson Middlebrooks , Markus Gerardus Martinus Maria Van Kraaij , Adrianus Cornelis Matheus Koopman , Stefan Hunsche , Willem Marie Julia Marcel Coene
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldkoven
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- The original application number of the division: US15533309
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03F7/00 ; G06T7/12 ; G06T7/149 ; G06T7/60

Abstract:
A method and apparatus of detection, registration and quantification of an image is described. The method may include obtaining an image of a lithographically created structure, and applying a level set method to an object, representing the structure, of the image to create a mathematical representation of the structure. The method may include obtaining a first dataset representative of a reference image object of a structure at a nominal condition of a parameter, and obtaining second dataset representative of a template image object of the structure at a non-nominal condition of the parameter. The method may further include obtaining a deformation field representative of changes between the first dataset and the second dataset. The deformation field may be generated by transforming the second dataset to project the template image object onto the reference image object. A dependence relationship between the deformation field and change in the parameter may be obtained.
Public/Granted literature
- US20220026811A1 METHOD AND APPARATUS FOR IMAGE ANALYSIS Public/Granted day:2022-01-27
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