Invention Grant
- Patent Title: Optical interconnections for hybrid testing using automated testing equipment
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Application No.: US16943353Application Date: 2020-07-30
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Publication No.: US11747396B2Publication Date: 2023-09-05
- Inventor: Steven William Keck , Crispin Cruz Mapagay , Mark Stenholm
- Applicant: OpenLight Photonics, Inc.
- Applicant Address: US CA Goleta
- Assignee: OpenLight Photonics, Inc.
- Current Assignee: OpenLight Photonics, Inc.
- Current Assignee Address: US CA Goleta
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G02B6/42 ; G01N21/31

Abstract:
A hybrid optical-electrical automated testing equipment (ATE) system can implement a workpress assembly that can interface with a device under test (DUT) and a load board that holds the DUT during testing, analysis, and calibration. A test hand can actuate to position the DUT on a socket and align one or more alignment features. The workpress assembly can include two optical interfaces that are optically coupled such that light can be provided to a side of the DUT that is facing away from the load board, thereby enabling the ATE system to perform simultaneous optical and electrical testing of the DUT.
Public/Granted literature
- US20220034963A1 OPTICAL INTERCONNECTIONS FOR HYBRID TESTING USING AUTOMATED TESTING EQUIPMENT Public/Granted day:2022-02-03
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