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公开(公告)号：US11693195B2
公开(公告)日：2023-07-04
申请号：US17865926
申请日：2022-07-15
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck , Roberto Marcoccia , Steve McGowan
CPC classification number: G02B6/4227 , G02B6/4225 , G02B6/4239 , G02B27/62
Abstract: An optical pick and place machine that includes a self-calibrating optical controller for error feedback based optical placement of optical components using active alignment is described. The optical controller can include a loopback mode to generate a baseline value of light generated by a light source and measured by a photodetector within the optical controller. The optical controller can further include an active alignment mode in which the light is coupled from the pick and place machine to the optical device on which the component is placed. The optical coupling of the placed component can be evaluated against the baseline value to ensure that the optical coupling is within specification (e.g., within a prespecified range).
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公开(公告)号：US11700057B2
公开(公告)日：2023-07-11
申请号：US17866129
申请日：2022-07-15
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck
IPC: H04B10/073 , G01R31/28
CPC classification number: H04B10/0731 , G01R31/2889
Abstract: A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test.
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Patent Agency Ranking
公开(公告)号：US20220350095A1
公开(公告)日：2022-11-03
申请号：US17865926
申请日：2022-07-15
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck , Roberto Marcoccia , Steve McGowan
Abstract: An optical pick and place machine that includes a self-calibrating optical controller for error feedback based optical placement of optical components using active alignment is described. The optical controller can include a loopback mode to generate a baseline value of light generated by a light source and measured by a photodetector within the optical controller. The optical controller can further include an active alignment mode in which the light is coupled from the pick and place machine to the optical device on which the component is placed. The optical coupling of the placed component can be evaluated against the baseline value to ensure that the optical coupling is within specification (e.g., within a prespecified range).
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公开(公告)号：US11428880B2
公开(公告)日：2022-08-30
申请号：US16945340
申请日：2020-07-31
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck , Roberto Marcoccia , Steve McGowan
Abstract: An optical pick and place machine that includes a self-calibrating optical controller for error feedback based optical placement of optical components using active alignment is described. The optical controller can include a loopback mode to generate a baseline value of light generated by a light source and measured by a photodetector within the optical controller. The optical controller can further include an active alignment mode in which the light is coupled from the pick and place machine to the optical device on which the component is placed. The optical coupling of the placed component can be evaluated against the baseline value to ensure that the optical coupling is within specification (e.g., within a prespecified range).
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公开(公告)号：US11411644B2
公开(公告)日：2022-08-09
申请号：US16943377
申请日：2020-07-30
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck
IPC: H04B10/073 , G01R31/28
Abstract: A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test.
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公开(公告)号：US11747396B2
公开(公告)日：2023-09-05
申请号：US16943353
申请日：2020-07-30
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck , Crispin Cruz Mapagay , Mark Stenholm
IPC: G01R31/317 , G02B6/42 , G01N21/31
CPC classification number: G01R31/3171 , G01N21/31 , G02B6/4226 , G01N2201/06113 , G01N2201/08
Abstract: A hybrid optical-electrical automated testing equipment (ATE) system can implement a workpress assembly that can interface with a device under test (DUT) and a load board that holds the DUT during testing, analysis, and calibration. A test hand can actuate to position the DUT on a socket and align one or more alignment features. The workpress assembly can include two optical interfaces that are optically coupled such that light can be provided to a side of the DUT that is facing away from the load board, thereby enabling the ATE system to perform simultaneous optical and electrical testing of the DUT.
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公开(公告)号：US20220352981A1
公开(公告)日：2022-11-03
申请号：US17866129
申请日：2022-07-15
Applicant: OpenLight Photonics, Inc.
Inventor： Steven William Keck
IPC: H04B10/073 , G01R31/28
Abstract: A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test.
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