Invention Grant
- Patent Title: Wavelength checker
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Application No.: US17633532Application Date: 2019-08-23
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Publication No.: US11747557B2Publication Date: 2023-09-05
- Inventor: Takuya Tanaka , Hiroshi Ishikawa , Kota Shikama , Atsushi Aratake
- Applicant: Nippon Telegraph and Telephone Corporation
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: Slater Matsil, LLP
- International Application: PCT/JP2019/033063 2019.08.23
- International Announcement: WO2021/038630A 2021.03.04
- Date entered country: 2022-02-07
- Main IPC: G02B6/12
- IPC: G02B6/12 ; G01M11/00 ; G01J1/58 ; G01J9/00 ; G02B6/13

Abstract:
A wavelength checker includes an optical converter composed of a conversion material that converts infrared light into visible light. The optical converter is disposed, on an output side (side from which light is output to an external space) of a plurality of first output waveguides of an optical waveguide chip, to receive emitted light that is guided through the first output waveguides and reflected on and emitted from the light emitting-side end surface. The light emitting-side end surface is a reflection surface that is inclined to face a main substrate.
Public/Granted literature
- US20220276435A1 Wavelength Checker Public/Granted day:2022-09-01
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