Invention Grant
- Patent Title: Transmission link testing
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Application No.: US17529775Application Date: 2021-11-18
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Publication No.: US11748220B2Publication Date: 2023-09-05
- Inventor: Rainer F. Bonitz , Binbin Huo
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F11/26 ; G06F3/06 ; G06F11/30

Abstract:
A computing system can comprise a processing resource and a memory device coupled together via a first transmission link. The processing resource can be configured to test the first transmission link in response to the memory device failing to execute a command by sending the command to the memory device again for retry and monitoring the first transmission link for signals that indicate whether the command was executed by the memory device.
Public/Granted literature
- US20220164268A1 TRANSMISSION LINK TESTING Public/Granted day:2022-05-26
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