Invention Grant
- Patent Title: Method of estimating a line width of a nanoparticle line formed using a capillary tube, and related methods
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Application No.: US17337070Application Date: 2021-06-02
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Publication No.: US11754483B2Publication Date: 2023-09-12
- Inventor: Szymon Zieba , Maciej Tybel , Piotr Kowalczewski , Filip Granek
- Applicant: XTPL S.A.
- Applicant Address: PL Wrocław
- Assignee: XTPL S.A.
- Current Assignee: XTPL S.A.
- Current Assignee Address: PL Wroclaw
- Agency: K&L Gates LLP
- Main IPC: G01N13/02
- IPC: G01N13/02

Abstract:
A method of obtaining a numerical model is disclosed. The numerical model correlates estimated line width values to minimum pressure for gas bubble generation (MPGBG) values. An MPGBG value of each capillary tube in the reference group is measured for a liquid. A nanoparticle composition is deposited, under standard conditions, on substrate(s) from each respective reference capillary tube, to form nanoparticle lines. A line width of each of the nanoparticle lines deposited using each respective reference capillary tube is measured by a microscope apparatus. A numerical model that correlates estimated line width values to MPGBG values for the liquid is calculated.
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