Invention Grant
- Patent Title: Determining threshold values for voltage distribution metrics
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Application No.: US17939594Application Date: 2022-09-07
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Publication No.: US11756636B2Publication Date: 2023-09-12
- Inventor: Vamsi Pavan Rayaprolu , Christopher M. Smitchger
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C7/22
- IPC: G11C7/22 ; G11C16/34 ; G11C16/24 ; G11C16/10 ; G11C16/04 ; G11C16/26

Abstract:
Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including determining a value of a data state metric associated with data stored in a part of a block of the memory device; responsive to determining that the value of the data state metric satisfies a first threshold criterion, determining a first value reflecting a voltage distribution metric associated with at least the part of the block; determining a second value reflecting at least one of a deterioration slope indicative of a data deterioration rate associated with a first portion of the memory device or an error rate associated with a second portion of the memory device; feeding the first value and the second value to a neural network; and receiving, from the neural network, an instruction to perform a media management operation.
Public/Granted literature
- US20220415412A1 DETERMINING THRESHOLD VALUES FOR VOLTAGE DISTRIBUTION METRICS Public/Granted day:2022-12-29
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