Invention Grant
- Patent Title: Automatic analyzer and automatic analysis method
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Application No.: US17023561Application Date: 2020-09-17
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Publication No.: US11768214B2Publication Date: 2023-09-26
- Inventor: Tsuyoshi Yaita
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: THE WEBB LAW FIRM
- Priority: JP 19171961 2019.09.20
- Main IPC: G01N35/10
- IPC: G01N35/10

Abstract:
An automatic analyzer includes: a specimen holding unit configured to hold a specimen container in which a specimen is stored; a dispensed container holding unit configured to hold a plurality of dispensed containers; a dispensing probe configured to separate a predetermined amount of the specimen from the specimen container, and configured to dispense the specimen into the dispensed container; a probe washing device configured to wash a leading end of the dispensing probe in a washing liquid; and a controller configured to control driving of the dispensing probe. The controller includes an arithmetic processing unit configured to calculate a concentration of the specimen in the specimen container. The specimen is subject to dilution with the washing liquid adhered to the leading end of the dispensing probe in the probe washing device. The arithmetic processing unit sets a maximum number of times for dispensing the specimen, based on the concentration.
Public/Granted literature
- US20210088544A1 Automatic Analyzer and Automatic Analysis Method Public/Granted day:2021-03-25
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