Invention Grant
- Patent Title: System and method for quality inspection on overall inkjet printing manufacturing process for display device
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Application No.: US17209138Application Date: 2021-03-22
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Publication No.: US11779946B2Publication Date: 2023-10-10
- Inventor: Jiankui Chen , Zhouping Yin , Qiangqiang Liu
- Applicant: HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Applicant Address: CN Hubei
- Assignee: HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Current Assignee: HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: CN Hubei
- Agency: JCIP GLOBAL INC.
- Priority: CN 2011622486.4 2020.12.30
- Main IPC: B41J2/21
- IPC: B41J2/21 ; B05B12/08 ; G06T7/00 ; H01L21/67 ; B05D1/02

Abstract:
The disclosure discloses a system for quality inspection in the entire process of inkjet printing manufacturing of display devices, which includes a substrate inspection module, a nozzle inspection module, an ink droplet inspection module, a coating thickness inspection module and a control module. Through design and matching of these modules, it is possible to realize a series of operations such as substrate inspection, nozzle inspection, flying ink droplet inspection, liquid coating inspection and cured coating inspection. The invention also discloses a corresponding quality inspection method for the entire inkjet printing manufacturing process for display devices. The invention effectively compensates for the shortcomings of current technology which only inspect a single stage without taking the whole process into consideration, thereby realizing high-precision quality inspection of each stage in the inkjet printing manufacturing process of display devices, and significantly improving the quality and yield of the display device product.
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Information query
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