Invention Grant
- Patent Title: AT-speed test access port operations
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Application No.: US18111679Application Date: 2023-02-20
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Publication No.: US11808810B2Publication Date: 2023-11-07
- Inventor: Lee D. Whetsel
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Carl G. Peterson; Frank D. Cimino
- The original application number of the division: US17692057 2022.03.10
- Main IPC: G01R31/3185
- IPC: G01R31/3185 ; G06F11/26 ; G01R31/3177 ; H10K50/814 ; H10K50/816 ; H10K50/844 ; H10K59/122 ; H10K59/123 ; H10K59/124 ; H10K59/121 ; H10K71/00 ; G01R31/317 ; H10K59/12 ; H10K102/00 ; H10K102/10 ; H01L27/12

Abstract:
In some examples, an integrated circuit comprises: a TDI input, a TDO output, a TCK input and a TMS input; a TAP state machine (TSM) having an input coupled to the TCK input, an input coupled to the TMS input, an instruction register control output, a TSM data register control (DRC) output, and a TSM state output; an instruction register having an input coupled to the TDI input, an output coupled to the TDO output, and a control input coupled to the instruction register control output of the TAP state machine; router circuitry including a TSM DRC input coupled to the TSM DRC output, a control DRC input coupled to the TSM state output, and a router DRC output; and a data register having an input coupled to the TDI input, an output coupled to the TDO output, and a data register DRC input coupled to the router DRC output.
Public/Granted literature
- US20230194604A1 AT-SPEED TEST ACCESS PORT OPERATIONS Public/Granted day:2023-06-22
Information query
IPC分类: