Invention Grant
- Patent Title: System and method for testing photosensitive device degradation
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Application No.: US17836944Application Date: 2022-06-09
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Publication No.: US11863122B2Publication Date: 2024-01-02
- Inventor: Michael D. Irwin , Jerome Lovelace , Kamil Mielczarek
- Applicant: CubicPV Inc.
- Applicant Address: US TX Dallas
- Assignee: CubicPV Inc.
- Current Assignee: CubicPV Inc.
- Current Assignee Address: US MA Bedford
- Agency: Baker Botts L.L.P.
- The original application number of the division: US15276378 2016.09.26
- Main IPC: H02S99/00
- IPC: H02S99/00 ; H02S50/15 ; H02S50/10

Abstract:
The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.
Public/Granted literature
- US20220302877A1 SYSTEM AND METHOD FOR TESTING PHOTOSENSITIVE DEVICE DEGRADATION Public/Granted day:2022-09-22
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