NICKEL OXIDE SOL-GEL INK
    2.
    发明公开

    公开(公告)号:US20230312936A1

    公开(公告)日:2023-10-05

    申请号:US18331261

    申请日:2023-06-08

    Applicant: CubicPV Inc.

    Abstract: A method for preparing a nickel oxide precursor ink comprising: preparing a solvent comprising diols and alcohol amines; adding nickel nitrate into the solvent to form a nickel nitrate containing solution; adding at least one metal acetate into the nickel nitrate containing solution to form a nickel nitrate and metal acetate containing solution; adding water to the nickel nitrate and metal acetate containing solution to form a nickel oxide precursor mixture; heating the nickel oxide precursor mixture to 60 to 75 Celsius; and cooling the nickel oxide precursor mixture to form the nickel oxide precursor ink.

    SYSTEM AND METHOD FOR TESTING PHOTOSENSITIVE DEVICE DEGRADATION

    公开(公告)号:US20220302877A1

    公开(公告)日:2022-09-22

    申请号:US17836944

    申请日:2022-06-09

    Applicant: CubicPV Inc.

    Abstract: The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

    System and method for testing photosensitive device degradation

    公开(公告)号:US11387779B2

    公开(公告)日:2022-07-12

    申请号:US17063157

    申请日:2020-10-05

    Applicant: CubicPV Inc.

    Abstract: The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

    System and method for testing photosensitive device degradation

    公开(公告)号:US11863122B2

    公开(公告)日:2024-01-02

    申请号:US17836944

    申请日:2022-06-09

    Applicant: CubicPV Inc.

    CPC classification number: H02S99/00 H02S50/10 H02S50/15

    Abstract: The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.

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