Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US17435479Application Date: 2019-03-27
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Publication No.: US11869745B2Publication Date: 2024-01-09
- Inventor: Minami Shouji , Natsuki Tsuno , Hiroya Ohta , Daisuke Bizen
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge, P.C.
- International Application: PCT/JP2019/013177 2019.03.27
- International Announcement: WO2020/194575A 2020.10.01
- Date entered country: 2021-09-01
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/22 ; H01J37/244 ; H01J37/26

Abstract:
An object of the invention is to provide a charged particle beam device capable of increasing the contrast of an observation image of a sample as much as possible in accordance with light absorption characteristics that change for each optical parameter. The charged particle beam device according to the invention changes an optical parameter such as a polarization plane of light emitted to the sample, and generates the observation image having a contrast corresponding to the changed optical parameter. An optical parameter that maximizes a light absorption coefficient of the sample is specified according to a feature amount of a shape pattern of the sample (refer to FIG. 5).
Public/Granted literature
- US20220139667A1 CHARGED PARTICLE BEAM DEVICE Public/Granted day:2022-05-05
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