Invention Grant
- Patent Title: Method to correct ion source inefficiencies makes sample-to-sample normalization possible
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Application No.: US17841098Application Date: 2022-06-15
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Publication No.: US11977008B2Publication Date: 2024-05-07
- Inventor: Christopher William Ward Beecher , Felice de Jong
- Applicant: IROA Technologies LLC
- Applicant Address: US NC Chapel Hill
- Assignee: IROA TECHNOLOGIES, LLC.
- Current Assignee: IROA TECHNOLOGIES, LLC.
- Current Assignee Address: US NC Chapel Hill
- Agency: Husch Blackwell LLP
- Main IPC: G01N1/28
- IPC: G01N1/28 ; H01J49/00

Abstract:
In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.
Public/Granted literature
- US20220317000A1 METHOD TO CORRECT ION SOURCE INEFFICIENCIES MAKES SAMPLE-TO-SAMPLE NORMALIZATION POSSIBLE Public/Granted day:2022-10-06
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