Invention Grant
- Patent Title: Failure area identification system
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Application No.: US17954119Application Date: 2022-09-27
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Publication No.: US11977433B2Publication Date: 2024-05-07
- Inventor: Hiroyuki Osaki , Tomohiro Kawaguchi
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Procopio, Cory, Hargreaves & Savitch LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07

Abstract:
Aspects of the present disclosure involve an innovative method for detecting error zones from a plurality of volume groups. The method may include creating a plurality of probe groups for error detection; detecting a new error associated with the plurality of probe groups and the plurality of volume groups; retrieving error information associated with the new error, wherein the error information comprises an error source, an error type, and an error time; retrieving an error correlation rule associated with the error information; determining if the error correlation rule is satisfied by the error information and information of other known errors; and identifying a common zone based on the error information and the information of the other known errors as an error zone.
Public/Granted literature
- US20240103949A1 FAILURE AREA IDENTIFICATION SYSTEM Public/Granted day:2024-03-28
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