Invention Publication
- Patent Title: FAILURE AREA IDENTIFICATION SYSTEM
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Application No.: US17954119Application Date: 2022-09-27
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Publication No.: US20240103949A1Publication Date: 2024-03-28
- Inventor: Hiroyuki OSAKI , Tomohiro KAWAGUCHI
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Chiyoda-ku, Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Chiyoda-ku, Tokyo
- Main IPC: G06F11/07
- IPC: G06F11/07

Abstract:
Aspects of the present disclosure involve an innovative method for detecting error zones from a plurality of volume groups. The method may include creating a plurality of probe groups for error detection; detecting a new error associated with the plurality of probe groups and the plurality of volume groups; retrieving error information associated with the new error, wherein the error information comprises an error source, an error type, and an error time; retrieving an error correlation rule associated with the error information; determining if the error correlation rule is satisfied by the error information and information of other known errors; and identifying a common zone based on the error information and the information of the other known errors as an error zone.
Public/Granted literature
- US11977433B2 Failure area identification system Public/Granted day:2024-05-07
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