- Patent Title: Projection system and projection calibration method using the same
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Application No.: US17540877Application Date: 2021-12-02
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Publication No.: US12023565B2Publication Date: 2024-07-02
- Inventor: Chung-Wei Chang , Yi-Ling Lee , Peng-Yu Chen , Fang-Ming Lee
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW 0131655 2021.08.26
- Main IPC: A63B69/40
- IPC: A63B69/40 ; A63B69/00 ; A63B102/18

Abstract:
A projection system includes a control module, a projection tube, an aiming driver, an observation device and an observation driver. The control module is configured to issue a first control command and a second control command. The aiming driver is electrically connected to the projection tube and configured to control, in response to the first control command, a projection viewing-line of the projection tube to be aligned with a calibration point. The observation driver is electrically connected to the observation device and configured to control, in response to the second control command, an observation viewing-line of the observation device to be aligned with the calibration point. The projection tube and the observation device are controlled asynchronously.
Public/Granted literature
- US20230072172A1 PROJECTION SYSTEM AND PROJECTION CALIBRATION METHOD USING THE SAME Public/Granted day:2023-03-09
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