Invention Grant
- Patent Title: Ion detector
-
Application No.: US17333129Application Date: 2021-05-28
-
Publication No.: US12074016B2Publication Date: 2024-08-27
- Inventor: Hiroshi Kobayashi , Sayaka Takatsuka
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JP 20101542 2020.06.11
- Main IPC: H01J49/02
- IPC: H01J49/02

Abstract:
An ion detector includes a microchannel plate configured to generate secondary electrons upon reception of ions incident thereon and multiply and output the generated secondary electrons; a plurality of electron impact-type diodes configured to have effective regions narrower than an effective region of the microchannel plate, receive the incident secondary electrons output from the microchannel plate, and multiply and detect the incident secondary electrons; a focus electrode configured to be disposed between the microchannel plate and the electron impact-type diodes and focus the secondary electrons toward the electron impact-type diodes; and a voltage supply part configured to apply a drive voltage to each of the plurality of electron impact-type diodes.
Public/Granted literature
- US20210391162A1 ION DETECTOR Public/Granted day:2021-12-16
Information query