- Patent Title: Three-dimensional measurement method, device, and storage medium
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Application No.: US18423054Application Date: 2024-01-25
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Publication No.: US12078475B2Publication Date: 2024-09-03
- Inventor: Jian Gao , Yizhong Zhuang , Lanyu Zhang , Haixiang Deng , Yun Chen , Xin Chen
- Applicant: GUANGDONG UNIVERSITY OF TECHNOLOGY
- Applicant Address: CN Guangzhou
- Assignee: GUANGDONG UNIVERSITY OF TECHNOLOGY
- Current Assignee: GUANGDONG UNIVERSITY OF TECHNOLOGY
- Current Assignee Address: CN Guangzhou
- Priority: CN 2210649253.6 2022.06.09
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G06T7/73 ; G06T7/80 ; G06T17/00 ; H04N13/239

Abstract:
A three-dimensional measurement method combines the three-step phase shift method to embed the marker line information into the sinusoidal stripe pattern to obtain the target stripe pattern. The target stripe pattern is projected onto the surface of the object to be measured, and the wrapped phase image, mean intensity image and modulated intensity image of the stripe pattern collected by the left and right cameras are solved. The mask image according to the mean intensity image and modulation intensity image is solved to extract the marker line. The spatial phase unwrapping starting from the marker line in the wrapped phase image is performed to obtain the spatial phase. The spatial phase matching based on the unique correspondence between the left and right cameras based on the spatial phase of the marker line is performed, the best matching point of the right camera is obtained.
Public/Granted literature
- US20240159521A1 THREE-DIMENSIONAL MEASUREMENT METHOD, DEVICE, AND STORAGE MEDIUM Public/Granted day:2024-05-16
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