Invention Grant
- Patent Title: Method of forming interconnect structure
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Application No.: US17411467Application Date: 2021-08-25
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Publication No.: US12080595B2Publication Date: 2024-09-03
- Inventor: Keunwook Shin , Sanghoon Ahn , Woojin Lee , Kyung-Eun Byun , Junghoo Shin , Hyeonjin Shin , Yunseong Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: HARNESS, DICKEY & PIERCE, P.L.C.
- Priority: KR 20200110589 2020.08.31
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/285

Abstract:
Provided is a method of forming an interconnect structure. The method includes preparing a substrate including a first metal layer and a first insulating layer, selectively forming a carbon layer having an sp2 bonding structure on the first metal layer, selectively forming a second insulating layer on the first insulating layer, forming a third insulating layer to cover the second insulating layer, and forming a second metal layer electrically connected to the first metal layer.
Public/Granted literature
- US20220068704A1 METHOD OF FORMING INTERCONNECT STRUCTURE Public/Granted day:2022-03-03
Information query
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