Invention Grant
- Patent Title: Defect detecting device and bag making apparatus
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Application No.: US17924349Application Date: 2021-04-22
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Publication No.: US12083765B2Publication Date: 2024-09-10
- Inventor: Yuji Ohnishi
- Applicant: Totani Corporation
- Applicant Address: JP Kyoto
- Assignee: Totani Corporation
- Current Assignee: Totani Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JP 20112435 2020.06.30
- International Application: PCT/JP2021/016312 2021.04.22
- International Announcement: WO2022/004102A 2022.01.06
- Date entered country: 2022-11-09
- Main IPC: B31B70/00
- IPC: B31B70/00 ; B31B70/10 ; B31B70/26 ; B31B155/00 ; B31B160/20

Abstract:
A defect detecting device includes a detection unit and a movement mechanism. The detection unit includes a support, an arm supported by the support swingably around a swing shaft, and a sensor for detecting a displacement of the arm relative to the support. The arm includes contactors. The movement mechanism keeps the contactors away from a feed plane during a feed phase of a sheet panel, and moves the contactors to the feed plane and then moves the contactors from the feed plane during a pause phase of the sheet panel. The defect detecting device further includes a determination part configured to determine whether a defect in bag making is present based on data from the sensor.
Public/Granted literature
- US20230182431A1 DEFECT DETECTING DEVICE AND BAG MAKING APPARATUS Public/Granted day:2023-06-15
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