• Patent Title: DEFECT DETECTING DEVICE AND BAG MAKING APPARATUS
  • Application No.: US17924349
    Application Date: 2021-04-22
  • Publication No.: US20230182431A1
    Publication Date: 2023-06-15
  • Inventor: Yuji OHNISHI
  • Applicant: Totani Corporation
  • Applicant Address: JP Kyoto
  • Assignee: Totani Corporation
  • Current Assignee: Totani Corporation
  • Current Assignee Address: JP Kyoto
  • Priority: JP 20112435 2020.06.30
  • International Application: PCT/JP2021/016312 2021.04.22
  • Date entered country: 2022-11-09
  • Main IPC: B31B70/00
  • IPC: B31B70/00 B31B70/10 B31B70/26
DEFECT DETECTING DEVICE AND BAG MAKING APPARATUS
Abstract:
A defect detecting device includes a detection unit and a movement mechanism. The detection unit includes a support, an arm supported by the support swingably around a swing shaft, and a sensor for detecting a displacement of the arm relative to the support. The arm includes contactors. The movement mechanism keeps the contactors away from a feed plane during a feed phase of a sheet panel, and moves the contactors to the feed plane and then moves the contactors from the feed plane during a pause phase of the sheet panel. The defect detecting device further includes a determination part configured to determine whether a defect in bag making is present based on data from the sensor.
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