Invention Grant
- Patent Title: Radiation detection apparatus and sample analysis apparatus
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Application No.: US17964340Application Date: 2022-10-12
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Publication No.: US12105229B2Publication Date: 2024-10-01
- Inventor: Genki Kinugasa , Kouji Miyatake , Kota Yanagihara , Ryuichi Isobe
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP 21168129 2021.10.13
- Main IPC: G01T1/17
- IPC: G01T1/17 ; G01T1/24 ; G01T1/36

Abstract:
There is provided a radiation detection apparatus capable of effectively discriminating between noise and X-ray signal. The radiation detection apparatus includes a detector for detecting radiation and producing a detector output signal, a first differential filter having a time constant and operative to differentiate and convert the detector output signal into a first pulsed signal, a second differential filter having a time constant greater than that of the first differential filter and operative to differentiate and convert the detector output signal into a second pulsed signal, and a noise detection section for detecting noise based on the difference in timing between peaks of the first and second pulsed signals.
Public/Granted literature
- US20230112252A1 Radiation Detection Apparatus and Sample Analysis Apparatus Public/Granted day:2023-04-13
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