• Patent Title: Analyzer apparatus and method of image processing
  • Application No.: US17825272
    Application Date: 2022-05-26
  • Publication No.: US12154254B2
    Publication Date: 2024-11-26
  • Inventor: Masaki MoritaNaoya Tanaka
  • Applicant: JEOL Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JP Tokyo
  • Priority: JP2021-119539 20210720
  • Main IPC: G06T5/70
  • IPC: G06T5/70 G06T5/20
Analyzer apparatus and method of image processing
Abstract:
There is provided an analyzer apparatus capable of generating crisp scanned images. In the analyzer apparatus, a sample is scanned with a probe such that a first signal and a second signal are emitted from the sample. The analyzer apparatus comprises: a first detector for detecting the first signal and producing a first detector signal; a second detector for detecting the second signal and producing a second detector signal; and an image processing unit operating (i) to produce a first scanned image and a second scanned image from the first detector signal and the second detector signal, respectively, (ii) to create a filter based on the second scanned image having a higher signal-to-noise ratio than that of the first scanned image, and (iii) to apply the filter to the first scanned image.
Public/Granted literature
Information query
Patent Agency Ranking
0/0