Invention Grant
- Patent Title: Analyzer apparatus and method of image processing
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Application No.: US17825272Application Date: 2022-05-26
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Publication No.: US12154254B2Publication Date: 2024-11-26
- Inventor: Masaki Morita , Naoya Tanaka
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Priority: JP2021-119539 20210720
- Main IPC: G06T5/70
- IPC: G06T5/70 ; G06T5/20

Abstract:
There is provided an analyzer apparatus capable of generating crisp scanned images. In the analyzer apparatus, a sample is scanned with a probe such that a first signal and a second signal are emitted from the sample. The analyzer apparatus comprises: a first detector for detecting the first signal and producing a first detector signal; a second detector for detecting the second signal and producing a second detector signal; and an image processing unit operating (i) to produce a first scanned image and a second scanned image from the first detector signal and the second detector signal, respectively, (ii) to create a filter based on the second scanned image having a higher signal-to-noise ratio than that of the first scanned image, and (iii) to apply the filter to the first scanned image.
Public/Granted literature
- US20230024406A1 Analyzer Apparatus and Method of Image Processing Public/Granted day:2023-01-26
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