Invention Grant
- Patent Title: Systems and methods for improving x-ray sources with switchable electron emitters
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Application No.: US17766245Application Date: 2020-10-04
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Publication No.: US12224150B2Publication Date: 2025-02-11
- Inventor: Nir Eden , Amir Ben Shalom , Hitoshi Masuya
- Applicant: NANO-X IMAGING LTD.
- Applicant Address: IL Neve Ilan
- Assignee: NANO-X IMAGING LTD.
- Current Assignee: NANO-X IMAGING LTD.
- Current Assignee Address: IL Neve Ilan
- Agency: AlphaPatent Associates Ltd.
- Agent Daniel J. Swirsky
- International Application: PCT/IB2020/059306 WO 20201004
- International Announcement: WO2021/064704 WO 20210408
- Main IPC: H01J35/00
- IPC: H01J35/00 ; A61B6/00 ; A61B6/03 ; A61B6/40 ; H01J35/02 ; H01J35/06

Abstract:
Systems and methods for improving x-ray sources with switchable electron emitters. Improved systems may use the functionality of the switchable electron emitters in various configurations to provide power regulation, multidimensional analysis, and electron beam forming so as to increase the durability and the reliability of the system. Cooling mechanisms may be used to further protect the anode from deterioration over time.
Public/Granted literature
- US20240047167A1 SYSTEMS AND METHODS FOR IMPROVING X-RAY SOURCES WITH SWITCHABLE ELECTRON EMITTERS Public/Granted day:2024-02-08
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