Invention Publication
- Patent Title: SYSTEMS AND METHODS FOR IMPROVING X-RAY SOURCES WITH SWITCHABLE ELECTRON EMITTERS
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Application No.: US17766245Application Date: 2020-10-04
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Publication No.: US20240047167A1Publication Date: 2024-02-08
- Inventor: NIR EDEN , AMIR BEN SHALOM , HITOSHI MASUYA
- Applicant: NANO-X IMAGING LTD.
- Applicant Address: IL NEVEILAN
- Assignee: NANO-X IMAGING LTD.
- Current Assignee: NANO-X IMAGING LTD.
- Current Assignee Address: IL NEVEILAN
- International Application: PCT/IB2020/059306 2020.10.04
- Date entered country: 2022-04-03
- Main IPC: H01J35/02
- IPC: H01J35/02 ; A61B6/03 ; A61B6/00 ; H01J35/06

Abstract:
Systems and methods for improving x-ray sources with switchable electron emitters. Improved systems may use the functionality of the switchable electron emitters in various configurations to provide power regulation, multidimensional analysis, and electron beam forming so as to increase the durability and the reliability of the system. Cooling mechanisms may be used to further protect the anode from deterioration over time.
Public/Granted literature
- US12224150B2 Systems and methods for improving x-ray sources with switchable electron emitters Public/Granted day:2025-02-11
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