Invention Grant
- Patent Title: Resistive random access memory device
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Application No.: US18417729Application Date: 2024-01-19
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Publication No.: US12322441B2Publication Date: 2025-06-03
- Inventor: Yu-Der Chih , Chung-Cheng Chou , Wen-Ting Chu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; H10B63/00 ; H10N70/00 ; H10N70/20

Abstract:
A memory architecture includes: a plurality of cell arrays each of which comprises a plurality of bit cells, wherein each of bit cells of the plurality of cell arrays uses a respective variable resistance dielectric layer to transition between first and second logic states; and a control logic circuit, coupled to the plurality of cell arrays, and configured to cause a first information bit to be written into respective bit cells of a pair of cell arrays as an original logic state of the first information bit and a logically complementary logic state of the first information bit, wherein the respective variable resistance dielectric layers are formed by using a same recipe of deposition equipment and have different diameters.
Public/Granted literature
- US20240153559A1 RESISTIVE RANDOM ACCESS MEMORY DEVICE Public/Granted day:2024-05-09
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