Invention Publication
- Patent Title: RESISTIVE RANDOM ACCESS MEMORY DEVICE
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Application No.: US18417729Application Date: 2024-01-19
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Publication No.: US20240153559A1Publication Date: 2024-05-09
- Inventor: Yu-Der CHIH , Chung-Cheng CHOU , Wen-Ting CHU
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu City
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu City
- Main IPC: G11C13/00
- IPC: G11C13/00 ; H10B63/00 ; H10N70/00 ; H10N70/20

Abstract:
A memory architecture includes: a plurality of cell arrays each of which comprises a plurality of bit cells, wherein each of bit cells of the plurality of cell arrays uses a respective variable resistance dielectric layer to transition between first and second logic states; and a control logic circuit, coupled to the plurality of cell arrays, and configured to cause a first information bit to be written into respective bit cells of a pair of cell arrays as an original logic state of the first information bit and a logically complementary logic state of the first information bit, wherein the respective variable resistance dielectric layers are formed by using a same recipe of deposition equipment and have different diameters.
Public/Granted literature
- US12322441B2 Resistive random access memory device Public/Granted day:2025-06-03
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