Invention Grant
- Patent Title: Method of operating memory cell
-
Application No.: US18191668Application Date: 2023-03-28
-
Publication No.: US12334148B2Publication Date: 2025-06-17
- Inventor: Kuo-Yu Hsiang , Min-Hung Lee
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. , NATIONAL TAIWAN UNIVERSITY , National Taiwan Normal University
- Applicant Address: TW Hsinchu; TW Taipei; TW Taipei
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,NATIONAL TAIWAN UNIVERSITY,National Taiwan Normal University
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,NATIONAL TAIWAN UNIVERSITY,National Taiwan Normal University
- Current Assignee Address: TW Hsinchu; TW Taipei; TW Taipei
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
A method of operating a memory cell includes the following steps. A first plurality of bias operations is performed to the memory cell using a first voltage, wherein the memory cell comprises a variable resistance pattern, and the first voltage of each cycle of the first plurality of bias operations has a same first polarity. The memory cell is determined whether reaches a fatigue threshold. After the determination determines that the memory cell reaches the fatigue threshold, a second plurality of bias operations is performed to the memory cell using a second voltage, wherein the second voltage of each cycle of the second plurality of bias operations has a same second polarity, and the second polarity is opposite to the first polarity.
Public/Granted literature
- US20240170059A1 METHOD OF OPERATING MEMORY CELL Public/Granted day:2024-05-23
Information query