Invention Publication
- Patent Title: METHOD OF OPERATING MEMORY CELL
-
Application No.: US18191668Application Date: 2023-03-28
-
Publication No.: US20240170059A1Publication Date: 2024-05-23
- Inventor: Kuo-Yu HSIANG , Min-Hung LEE
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. , NATIONAL TAIWAN UNIVERSITY , National Taiwan Normal University
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,NATIONAL TAIWAN UNIVERSITY,National Taiwan Normal University
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,NATIONAL TAIWAN UNIVERSITY,National Taiwan Normal University
- Current Assignee Address: TW Hsinchu; TW TAIPEI; TW Taipei City
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
A method of operating a memory cell includes the following steps. A first plurality of bias operations is performed to the memory cell using a first voltage, wherein the memory cell comprises a variable resistance pattern, and the first voltage of each cycle of the first plurality of bias operations has a same first polarity. The memory cell is determined whether reaches a fatigue threshold. After the determination determines that the memory cell reaches the fatigue threshold, a second plurality of bias operations is performed to the memory cell using a second voltage, wherein the second voltage of each cycle of the second plurality of bias operations has a same second polarity, and the second polarity is opposite to the first polarity.
Public/Granted literature
- US12334148B2 Method of operating memory cell Public/Granted day:2025-06-17
Information query